TRACE ANALYSIS USING A COMMERCIAL RESONANT IONIZATION MASS-SPECTROMETER

A resonant ionisation mass spectrometer designed in Glasgow University and constructed by Kratos Analytical is described in detail. Samples can be ablated by either an argon ion gun or an Nd:YAG laser. The instrument is fitted with a time-of-flight mass spectrometer of reflectron type. Laser ablated resonant ionisation spectra of standard reference materials show that the instrument is capable of sensitivities down to the ppm level. Methods of improving the signal-to-background, such that sub-ppm sensitivities can be reached, are discussed. © 1990.