MEASUREMENT OF REFRACTIVE-INDEXES OF NEON, ARGON, KRYPTON AND XENON IN THE 253.7-140.4 NM WAVELENGTH RANGE - DISPERSION-RELATIONS AND ESTIMATED OSCILLATOR-STRENGTHS OF THE RESONANCE LINES

被引:117
作者
BIDEAUMEHU, A
GUERN, Y
ABJEAN, R
JOHANNINGILLES, A
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D O I
10.1016/0022-4073(81)90057-1
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:395 / 402
页数:8
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