MAPPING INDUCTION DISTRIBUTIONS BY TRANSMISSION ELECTRON-MICROSCOPY

被引：25

作者：

CHAPMAN, JN

MCVITIE, S

HEFFERMAN, SJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 69卷 / 08期

关键词：

D O I：

10.1063/1.347775

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The Foucault and differential phase contrast modes of transmission electron microscopy are described and their uses for mapping induction distributions in magnetic thin films compared. The former is simpler to implement but the latter can provide quantitative information to much higher spatial resolution. Examples are given of instances where each is most suitable. Foucault images recorded during in situ magnetizing experiments provide valuable information on the magnetization process in small regular particles while the detailed magnetization distribution close to walls in soft magnetic films is best investigated using modified differential phase contrast microscopy.

引用

页码：6078 / 6083

页数：6

共 13 条

[1] THE INVESTIGATION OF MAGNETIC DOMAIN-STRUCTURES IN THIN FOILS BY ELECTRON-MICROSCOPY [J].