THERMAL-WAVE IMAGING OF VOIDS IN STRUCTURAL CERAMICS

被引：3

作者：

NO, K ^{[1
]}

MCCLELLAND, JF ^{[1
]}

机构：

[1] IOWA STATE UNIV SCI & TECHNOL,US DOE,AMES LAB,AMES,IA 50011

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 05期

关键词：

D O I：

10.1063/1.341584

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2801 / 2803

页数：3

共 13 条

[1] PHOTOACOUSTIC CHARACTERIZATION OF SUBSURFACE DEFECTS IN PLASMA-SPRAYED COATINGS [J].

AITHAL, S ;

ROUSSET, G ;

BERTRAND, L ;

CIELO, P ;

DALLAIRE, S .

THIN SOLID FILMS, 1984, 119 (02) :153-158

[2] THERMAL WAVE INTERFEROMETRY - A POTENTIAL APPLICATION OF THE PHOTO-ACOUSTIC EFFECT [J].

BENNETT, CA ;

PATTY, RR .

APPLIED OPTICS, 1982, 21 (01) :49-54

[3] OPTOACOUSTIC PHASE-ANGLE MEASUREMENT FOR PROBING A METAL [J].

BUSSE, G .

APPLIED PHYSICS LETTERS, 1979, 35 (10) :759-760

[4] LIGHT-SCATTERING EFFECTS IN PHOTOACOUSTIC-SPECTROSCOPY [J].

HELANDER, P ;

LUNDSTROM, I ;

MCQUEEN, D .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) :3841-3847

[5]

KHANDELWAL PK, 1985, AM CERAM SOC BULL, V64, P1112

[6]

KINGERY WD, 1976, INTRO CERAMICS, P809

[7]

LARSEN DC, 1983, AFWALTR834141 US AIR

[8]

MCCLELLAND JF, 1983, ANAL CHEM, V55, pA89, DOI 10.1021/ac00252a003

[9] PHOTOACOUSTIC SIGNAL CHANGES ASSOCIATED WITH VARIATIONS IN SEMICONDUCTOR CRYSTALLINITY [J].

MCCLELLAND, JF ;

KNISELEY, RN .

APPLIED PHYSICS LETTERS, 1979, 35 (08) :585-587

[10]

RINGERMACHER HI, 1987, REV PROG QUANTITAT B, V6, P1231

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