ELASTIC PROPERTIES OF THIN FCC FILMS

被引：50

作者：

STREITZ, FH ^{[1
]}

SIERADZKI, K ^{[1
]}

CAMMARATA, RC ^{[1
]}

机构：

[1] JOHNS HOPKINS UNIV,DEPT MAT SCI & ENGN,BALTIMORE,MD 21218

来源：

PHYSICAL REVIEW B | 1990年 / 41卷 / 17期

关键词：

D O I：

10.1103/PhysRevB.41.12285

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report the results of molecular-dynamics simulations on oriented fcc thin films. For thin films of (001) orientation we found that independent of the potential, the intrinsic structural instability of these films governed their elastic properties. All of the in-plane elastic constants increase with decreasing film thickness for thin (111) films modeled with use of embedded-atom-method potentials, whereas (111) films modeled with use of a Lennard-Jones potential gave entirely opposite results. © 1990 The American Physical Society.

引用

页码：12285 / 12287

页数：3

共 22 条

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