THE STRUCTURE OF HEXAMETHYLCYCLOTRISILOXANE AS DETERMINED BY THE DIFFRACTION OF ELECTRONS ON THE VAPOR

被引：57

作者：

AGGARWAL, EH

BAUER, SH

机构：

来源：

JOURNAL OF CHEMICAL PHYSICS | 1950年 / 18卷 / 01期

关键词：

D O I：

10.1063/1.1747454

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：42 / 50

页数：9

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[1] DIELECTRIC CONSTANTS OF DIMETHYL SILOXANE POLYMERS
BAKER, EB
BARRY, AJ
HUNTER, MJ
[J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1946, 38 (11): : 1117 - 1120
[2] ALKYLSILAZANES AND SOME RELATED COMPOUNDS
BREWER, SD
HABER, CP
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1948, 70 (11) : 3888 - 3891
[3] The electron diffraction investigation of the molecular structures of (1) Phosphorus oxytrichloride, oxydichlorofluoride, oxychlorodifluoride, oxytrifluoride, fluorodichloride, pentafluoride, and trifluorodichloride, and of (2) Disilane, trichlorosilane, and hexachlorodisilane
Brockway, LO
Beach, JY
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 : 1836 - 1846
[4] The electron diffraction study of paraldehyde
Carpenter, DC
Brockway, L
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1936, 58 : 1270 - 1273
[5] THE STRUCTURE OF HEXADECAMETHYLCYCLOOCTASILOXANE
FREVEL, LK
HUNTER, MJ
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1945, 67 (12) : 2275 - 2275
[6] Gerding H, 1939, RECL TRAV CHIM PAY-B, V58, P614
[7] AN ELECTRON DIFFRACTION INVESTIGATION OF THE STRUCTURES OF NEOPENTYL CHLORIDE AND SILICO-NEOPENTYL CHLORIDE - THE DETERMINATION OF INTENSITIES THROUGH THE USE OF A ROTATING SECTOR
HASTINGS, JM
BAUER, SH
[J]. JOURNAL OF CHEMICAL PHYSICS, 1950, 18 (01) : 13 - 26
[8] ORGANO-SILICON POLYMERS - THE CYCLIC DIMETHYL SILOXANES
HUNTER, MJ
HYDE, JF
WARRICK, EL
FLETCHER, HJ
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1946, 68 (04) : 667 - 672
[9] Dipole moment and structure of trioxane
Maryott, AA
Acree, SF
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1944, 33 (01): : 71 - U28
[10] Moerman NF, 1937, RECL TRAV CHIM PAY-B, V56, P161