IN-SITU FIELD ION MICROSCOPE STUDY OF IRRADIATED TUNGSTEN .2. ANALYSIS AND INTERPRETATION

被引:45
作者
SCANLAN, RM
STYRIS, DL
SEIDMAN, DN
机构
来源
PHILOSOPHICAL MAGAZINE | 1971年 / 23卷 / 186期
关键词
D O I
10.1080/14786437108217014
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1459 / &
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