A NOVEL TYPE OF LASER SCANNING MICROSCOPE - THEORETICAL CONSIDERATIONS

被引：4

作者：

OOKI, H

IWASAKI, J

机构：

[1] Research and Development Department, Nikon Corporation, Shinagawa-ku, Tokyo, 140

来源：

OPTICS COMMUNICATIONS | 1991年 / 85卷 / 2-3期

关键词：

Laser Beams--Propagation - Microscopic Examination--Scanning Electron Microscopy - Waveguides; Optical;

D O I：

10.1016/0030-4018(91)90390-Y

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A novel type of confocal laser scanning microscope using a waveguide device is proposed and theoretical considerations are given. This microscope is capable of obtaining an image with differential interference contrast by means of mode interference in the waveguide device. The performance of this microscope was analyzed using Fourier optics and the two-dimensional beam propagation method. The outstanding feature of this microscope is its capability of obtaining information from the object about its phase and amplitude separately.

引用

页码：177 / 182

页数：6