COMPUTER-CONTROLLED TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS

被引：43

作者：

HALL, TM

WAGNER, A

SEIDMAN, DN

机构：

[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

[2] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1977年 / 10卷 / 09期

关键词：

D O I：

10.1088/0022-3735/10/9/013

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：884 / 893

页数：10

相关论文

共 52 条

[1] ANDREN HO, 1975, 22ND P INT FIELD EM
[2] QUANTITATIVE STUDY OF VACANCY DEFECTS IN QUENCHED PLATINUM BY FIELD-ION MICROSCOPY AND ELECTRICAL RESISTIVITY .1. EXPERIMENTAL RESULTS
BERGER, AS
SEIDMAN, DN
BALLUFFI, RW
[J]. ACTA METALLURGICA, 1973, 21 (02): : 123 - 135
[3] 10-NSEC RESOLUTION COUNTER FOR MULTIPARTICLE ATOM PROBE TIME-OF-FLIGHT MEASUREMENTS
BERGER, AS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (05) : 592 - 594
[4] AUSTENITIC STAINLESS-STEELS WITH IMPROVED RESISTANCE TO RADIATION-INDUCED SWELLING
BLOOM, EE
STIEGLER, JO
ROWCLIFFE, AF
LEITNAKER, JM
[J]. SCRIPTA METALLURGICA, 1976, 10 (04): : 303 - 308
[5] CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE
BRENNER, SS
MCKINNEY, JT
[J]. SURFACE SCIENCE, 1970, 23 (01) : 88 - &
[6] FIM-ATOM PROBE ANALYSIS OF THIN NITRIDE PLATELETS IN FE-3 AT . PERCENT MO
BRENNER, SS
GOODMAN, SR
[J]. SCRIPTA METALLURGICA, 1971, 5 (10): : 865 - &
[7] PERFORMANCE OF ELECTRON MULTIPLIERS IN FIM ATOM PROBES
BRENNER, SS
MCKINNEY, JT
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (09) : 1264 - +
[8] ON IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN FIM-ATOM PROBE
BRENNER, SS
MCKINNEY, JT
[J]. APPLIED PHYSICS LETTERS, 1968, 13 (01) : 29 - &
[9] CHAMBERS RS, 1975, 22ND P INT FIELD EM, P74
[10] CHANG WH, 1963, HIGH TEMPERATURE MAT, P347

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