LOW-FREQUENCY RAMAN-SCATTERING FROM SMALL SILVER PARTICLES EMBEDDED IN SIO2 THIN-FILMS

被引:202
作者
FUJII, M [1 ]
NAGAREDA, T [1 ]
HAYASHI, S [1 ]
YAMAMOTO, K [1 ]
机构
[1] KOBE UNIV,FAC ENGN,DEPT ELECTR ENGN,KOBE 657,JAPAN
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 12期
关键词
D O I
10.1103/PhysRevB.44.6243
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Intense, low-frequency Raman scattering from localized acoustic vibrations of small, spherical Ag particles embedded in SiO2 thin films has been observed. It was found that the Raman peak shifts to higher frequencies as the particle size decreases. For Ag particles smaller than 4 nm, the size dependence of the peak frequency can be well explained by Lamb's theory, which gives vibrational frequencies of a homogeneous elastic body with a spherical form. The Raman scattering observed is relatively strong and believed to be enhanced by the excitation of the surface plasmons localized in the Ag particles; the enhancement mechanism is analogous to the case of surface-enhanced Raman scattering from molecules adsorbed on rough metal surfaces.
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页码:6243 / 6248
页数:6
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