EFFECTS OF VACUUM DEPOSITION CONDITIONS ON ELLIPSOMETRIC PARAMETERS, OPTICAL-CONSTANTS, AND REFLECTANCE OF ULTRAPURE ALUMINUM FILMS

被引：22

作者：

HALFORD, JH

CHIN, FK

NORMAN, JE

机构：

[1] DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706

[2] USA,RES OFF,DURHAM,NC

[3] DUKE UNIV,DURHAM,NC 27706

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1973年 / 63卷 / 07期

关键词：

D O I：

10.1364/JOSA.63.000786

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：786 / 792

页数：7

共 18 条

[1] REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM AND ALUMINUM - MAGNESIUM FLUORIDE FILMS IN ULTRAVIOLET (]1800 A)
BATES, B
BRADLEY, DJ
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 481 - &
[2] INFRARED REFLECTANCE OF ALUMINUM EVAPORATED IN ULTRA-HIGH VACUUM
BENNETT, HE
ASHLEY, EJ
SILVER, M
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (09) : 1089 - &
[3] INFRARED REFLECTANCE OF EVAPORATED ALUMINUM FILMS
BENNETT, HE
ASHLEY, EJ
BENNETT, JM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (11) : 1245 - &
[4] REFLECTANCE-INCREASING COATINGS FOR THE VACUUM ULTRAVIOLET AND THEIR APPLICATIONS
BERNING, PH
HAAS, G
MADDEN, RP
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (06) : 586 - 597
[5] BERNING PH, 1961, J OPT SOC AM, V51, P719
[6] OPTICAL CONSTANTS OF ALUMINUM FILMS RELATED TO VACUUM ENVIRONMENT
FANE, RW
NEAL, WEJ
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (06) : 790 - &
[7] FILMED SURFACES FOR REFLECTING OPTICS
HASS, G
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (11) : 945 - 952
[8] REFLECTANCE OF EVAPORATED ALUMINUM IN THE VACUUM ULTRAVIOLET
HASS, G
HUNTER, WR
TOUSEY, R
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (12) : 1009 - 1012
[9] INFLUENCE OF PURITY, SUBSTRATE TEMPERATURE, AND AGING CONDITIONS ON THE EXTREME ULTRAVIOLET REFLECTANCE OF EVAPORATED ALUMINUM
HASS, G
HUNTER, WR
TOUSEY, R
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (12) : 1070 - 1073
[10] HOLLAND L, 1958, VACUUM DEPOSITION TH, pCH6

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