SURFACE RECONSTRUCTIONS OF GAAS(100) OBSERVED BY SCANNING TUNNELING MICROSCOPY

被引:657
作者
BIEGELSEN, DK
BRINGANS, RD
NORTHRUP, JE
SWARTZ, LE
机构
[1] Xerox Corporation, Palo Alto Research Center, Palo Alto
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 09期
关键词
D O I
10.1103/PhysRevB.41.5701
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present atomic-resolution images, obtained with scanning tunneling microscopy (STM), of the various reconstructions of smooth, in situ grown GaAs(100) surfaces. The outermost layer of the c(4×4) reconstruction consists of three As-As adatom dimers parallel to [011]. Cells containing two or three As-As dimers have been observed on the 2×4 surface. The 1×6 surface seen in low-energy electron diffraction has a 2×6 unit cell containing two As-As dimers. Diffraction patterns implying 4×6 symmetry are seen to arise from the coexistence of 2×6 and 4×2 units. The c(8×2) surface is made up of two Ga-Ga dimers and two missing dimers per 4×2 cell. Atomic models, which are consistent with both the STM images and electron-counting heuristics, are also shown. © 1990 The American Physical Society.
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页码:5701 / 5706
页数:6
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