LOSSES OF TAPERED DIELECTRIC SLAB WAVE-GUIDES WITH AXIAL VARIATIONS IN INDEX OF REFRACTION

被引：5

作者：

SCARMOZZINO, R

PODLESNIK, DV

OSGOOD, RM

机构：

[1] COLUMBIA UNIV,CTR TELECOMMUN RES,NEW YORK,NY 10027

[2] COLUMBIA UNIV,ELECT ENGN & APPL PHYS,NEW YORK,NY 10027

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1990年 / 38卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/22.46423

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effects of varying the index of refraction in the cladding along the length of a tapered dielectric waveguide are calculated using a local normal mode analysis. It is found that in some cases the losses can be reduced by an order of magnitude, even for short tapers whose length is of the order of the guide dimensions. © 1990 IEEE

引用

页码：141 / 147

页数：7

共 11 条

[1] GAAS, ALAS, AND ALXGA1-XAS - MATERIAL PARAMETERS FOR USE IN RESEARCH AND DEVICE APPLICATIONS [J].