GIANT MAGNETORESISTANCE IN SPUTTER DEPOSITED CO/CU MULTILAYER SYSTEMS

被引:30
作者
TOMLINSON, ME
POLLARD, RJ
LORD, DG
GRUNDY, PJ
机构
[1] Department of Pure and Applied Physics, University of Salford, Salford
关键词
D O I
10.1016/0304-8853(92)91059-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents some results of magnetoresistance measurements on sputter deposited Co/Cu thin film multilayers. We find that large values of magnetoresistance approaching 40% can be obtained and that these values oscillate in magnitude with the thickness of the non-magnetic spacing layer with a period of about 1.1 nm. It appears that the multilayer must be grown on a particular form of underlayer to realize these large values of magnetoresistance ratio.
引用
收藏
页码:79 / 82
页数:4
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