VOLUME AND SURFACE RESISTIVITY MEASUREMENT METHODS USING ALTERNATING CURRENT

[1] ABELES F, 1963, PROGRESS OPTICS, V2

[2] A METHOD OF DETERMINING ELECTRICAL RESISTIVITIES AT LOW TEMPERATURES [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (07) : 958 - 958

[3] BAVEJA KD, 1961, J SCI IND RES B, V20, P343

[4] AMELIORATION DE LA CONDUCTIVITE SUPERFICIELLE DU CUIVRE ET DE LALUMINIUM EN HYPERFREQUENCES PAR ABAISSEMENT DE TEMPERATURE [J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 44 (01): : 18 - &

[5] THE MEASUREMENT OF HIGH STANDING-WAVE RATIOS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1952, 99 (04): : 372 - 375

[6] BURGER JP, 1965, J PHYS-PARIS, V26, pA177

[7] CONTACTLESS INDUCTION METHOD FOR ELECTRIC RESISTIVITY MEASUREMENT [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (03) : 940 - +

[8] CHAMBER RG, 1952, I MET MONOGRAPH, V13, P281

[9] CHATTERJEE SK, 1954, J INDIAN I SC B, V36, P107

[10] CLARKE JM, 1966, APPL MATER RES, V5, P181

[1] ABELES F, 1963, PROGRESS OPTICS, V2

[2] A METHOD OF DETERMINING ELECTRICAL RESISTIVITIES AT LOW TEMPERATURES [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (07) : 958 - 958

[3] BAVEJA KD, 1961, J SCI IND RES B, V20, P343

[4] AMELIORATION DE LA CONDUCTIVITE SUPERFICIELLE DU CUIVRE ET DE LALUMINIUM EN HYPERFREQUENCES PAR ABAISSEMENT DE TEMPERATURE [J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 44 (01): : 18 - &

[5] THE MEASUREMENT OF HIGH STANDING-WAVE RATIOS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1952, 99 (04): : 372 - 375

[6] BURGER JP, 1965, J PHYS-PARIS, V26, pA177

[7] CONTACTLESS INDUCTION METHOD FOR ELECTRIC RESISTIVITY MEASUREMENT [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (03) : 940 - +

[8] CHAMBER RG, 1952, I MET MONOGRAPH, V13, P281

[9] CHATTERJEE SK, 1954, J INDIAN I SC B, V36, P107

[10] CLARKE JM, 1966, APPL MATER RES, V5, P181