High-temperature X-ray structural, thermal and dielectric characteristics of ferroelectric Bi2VO5.5

被引:12
作者
Prasad, KVR
Varma, KBR
机构
[1] Materials Research Centre, Indian Institute of Science, Bangalore
关键词
D O I
10.1007/BF00369686
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The X-ray powder diffraction, dielectric and thermal studies of bismuth vanadate (Bi2VO5.5) ceramic have been carried out as a function of temperature (300-900 K). The high-temperature X-ray studies, supported by differential scanning calorimetry, clearly demonstrate that Bi2VO5.5 undergoes two major phase transitions at similar to 730 and similar to 835 K. It was found that the one at 730 K is associated with both the ferroelectric and the crystallographic transition, while at 835 K, Bi2VO5.5 undergoes only the crystallographic transition. Anomalies in both the dielectric constant and specific heat curves have been observed at similar to 730 and similar to 835 K. The total heat, Delta Q, and entropy, Delta S, associated with the transition at 730 K were found to be higher than those at 835 K.
引用
收藏
页码:6345 / 6349
页数:5
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