XE-ADLAYERS ON PT(111) AND PD(111) - STRUCTURE INVESTIGATION BY SPIN-POLARIZED LEED

被引:5
作者
HILGERS, G [1 ]
POTTHOFF, M [1 ]
WIRTH, S [1 ]
MULLER, N [1 ]
HEINZMANN, U [1 ]
HAUNERT, L [1 ]
BRAUN, J [1 ]
BORSTEL, G [1 ]
机构
[1] UNIV OSNABRUCK,FACHBEREICH PHYS,W-4500 OSNABRUCK,GERMANY
关键词
D O I
10.1016/0039-6028(91)91065-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
(square-root 3 x square-root 3)R30-degrees Xe-layers on Pt(111) and Pd(111) are studied by spin-polarized LEED. In the experiment spin-polarized electrons from a GaAs photoemission source were scattered and the spin-dependent intensities are measured in different diffracted beams. Corresponding calculations were performed using a new relativistic LEED code. Measurements and calculations agree reasonably. They show strong contributions from multiple scattering between substrate and adlayer, and therefore spin-polarized LEED reveals strong sensitivity to structural parameters.
引用
收藏
页码:612 / 615
页数:4
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