ELECTRIC FIELD AND STRESS ON A FIELD-ION SPECIMEN

[1] THE USE OF THE FIELD EMISSION ELECTRON MICROSCOPE IN ADSORPTION STUDIES OF W ON W AND BA ON W [J]. BELL SYSTEM TECHNICAL JOURNAL, 1951, 30 (04): : 907 - 932

[2] COMPARISON OF TIPS THIN WIRES AND SHARP METAL EDGES AS EMITTERS FOR FIELD IONIZATION MASS SPTROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (02): : 118 - &

[3] BLEANEY BI, 1965, ELECTRICITY MAGNETIS

[4] BORISOV VT, 1968, INSTRUM EXP TECH, V2, P952

[5] BOWKETT K, 1969, INT C RELATIONSHIP P

[6] BULLOUGH R, 1964, PGECL33 AERE

[7] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[8] ESHELBY J, 1967, PRIVATE COMMUNICATIO

[9] Fields currents from points [J]. PHYSICAL REVIEW, 1928, 31 (05): : 0900 - 0909

[10] INTERPRETATION OF FIELD-ION MICROGRAPHS - CONTRAST FROM PERFECT DISLOCATION LOOPS [J]. PHILOSOPHICAL MAGAZINE, 1968, 17 (145): : 169 - &

[1] THE USE OF THE FIELD EMISSION ELECTRON MICROSCOPE IN ADSORPTION STUDIES OF W ON W AND BA ON W [J]. BELL SYSTEM TECHNICAL JOURNAL, 1951, 30 (04): : 907 - 932

[2] COMPARISON OF TIPS THIN WIRES AND SHARP METAL EDGES AS EMITTERS FOR FIELD IONIZATION MASS SPTROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (02): : 118 - &

[3] BLEANEY BI, 1965, ELECTRICITY MAGNETIS

[4] BORISOV VT, 1968, INSTRUM EXP TECH, V2, P952

[5] BOWKETT K, 1969, INT C RELATIONSHIP P

[6] BULLOUGH R, 1964, PGECL33 AERE

[7] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[8] ESHELBY J, 1967, PRIVATE COMMUNICATIO

[9] Fields currents from points [J]. PHYSICAL REVIEW, 1928, 31 (05): : 0900 - 0909

[10] INTERPRETATION OF FIELD-ION MICROGRAPHS - CONTRAST FROM PERFECT DISLOCATION LOOPS [J]. PHILOSOPHICAL MAGAZINE, 1968, 17 (145): : 169 - &