THE OBSERVATION OF AMORPHOUS MATERIALS AT HIGH-VOLTAGE AND HIGH-RESOLUTION

被引：7

作者：

SMITH, DJ ^{[1
]}

SAXTON, WO ^{[1
]}

CLEAVER, JRA ^{[1
]}

CATTO, CJD ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1980年 / 119卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1980.tb04072.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：19 / 28

页数：10

共 20 条

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[2]

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HERD, SR ;

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[4]

CLEAVER JRA, 1977, OPTIK, V48, P95

[5]

COSSLETT VE, 1977, HIGH VOLTAGE ELECTRO, P87

[6]

DIETRICH I, 1977, ULTRAMICROSCOPY, V2, P241

[7]

FRANK J, 1976, OPTIK, V44, P379

[8]

FREEMAN LA, 1977, STRUCTURE NONCRYSTAL, P245

[9] INTERPRETATION OF ELECTRON MICROGRAPHS AND DIFFRACTION PATTERNS OF AMORPHOUS MATERIALS [J].

HOWIE, A ;

KRIVANEK, OL ;

RUDEE, ML .

PHILOSOPHICAL MAGAZINE, 1973, 27 (01) :235-255

[10] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS [J].

HOWIE, A .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) :41-55

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