STRUCTURAL CHARACTERIZATION OF FE/CU MULTILAYERS BY X-RAY ABSORPTION-SPECTROSCOPY

被引：33

作者：

PIZZINI, S

BAUDELET, F

CHANDESRIS, D

FONTAINE, A

MAGNAN, H

GEORGE, JM

PETROFF, F

BARTHELEMY, A

FERT, A

LOLOEE, R

SCHROEDER, PA

机构：

[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE

[2] MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES,E LANSING,MI 48824

[3] MICHIGAN STATE UNIV,DEPT PHYS & ASTRON,E LANSING,MI 48824

[4] UNIV NANCY 1,PHYS SOLIDES LAB,F-54506 VANDOEUVRE NANCY,FRANCE

[5] CENS,SERV RECH SURFACES & IRRADIAT MATIERE,F-91191 GIF SUR YVETTE,FRANCE

来源：

PHYSICAL REVIEW B | 1992年 / 46卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.46.1253

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The local structure of Fe/Cu multilayers prepared by sputtering is studied by x-ray absorption spectroscopy (XAS). We find that thin Cu layers grow with the bcc structure imposed by the Fe layers. For larger thicknesses, the Cu films are more disordered and beyond 13 angstrom the films relax to fcc structure. The thickness dependence of the magnetoresistance of the multilayers is discussed in the light of the XAS results.

引用

页码：1253 / 1256

页数：4

共 16 条

[1] CONCURRENT ENHANCEMENT OF KERR ROTATION AND ANTIFERROMAGNETIC COUPLING IN EPITAXIAL FE/CU/FE STRUCTURES [J].