RAPID INTERFEROMETRIC TECHNIQUE FOR MTF MEASUREMENTS IN VISIBLE OR INFRARED REGION

被引：14

作者：

KELSALL, D ^{[1
]}

机构：

[1] MIT,LINCOLN LAB,LEXINGTON,MA 02173

来源：

APPLIED OPTICS | 1973年 / 12卷 / 07期

关键词：

D O I：

10.1364/AO.12.001398

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1398 / 1399

页数：2

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