MAGNETIC-PROPERTIES AND CRYSTALLOGRAPHY OF DOUBLE-LAYER COCRTA THIN-FILMS WITH VARIOUS INTERLAYERS

被引：6

作者：

FENG, YC ^{[1
]}

LAUGHLIN, DE ^{[1
]}

LAMBETH, DN ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,CTR DATA STORAGE SYST,DEPT ELECT & COMP ENGN,PITTSBURGH,PA 15213

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期

基金：

美国国家科学基金会; 美国安德鲁·梅隆基金会;

关键词：

D O I：

10.1109/20.333957

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work, the hysteretic properties and remanence curves of double-layer CoCrTa thin films with various interlayers (Al, Cu, Ag, and Cr) are investigated. It is found that the double-layer CoCrTa films with Cu or Ag interlayers have narrower switching field distributions but similar high coercivities, compared with the films with Cr interlayers. To understand the effects of interlayers on the magnetic properties, the crystallography of epitaxy in these multilayer thin films are also studied. The results from this work show that Ag and Cu are strong candidates as interlayer materials in multilayer magnetic recording media.

引用

页码：3960 / 3962

页数：3

共 9 条

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