THICK-FILM THERMOMETERS WITH PREDICTABLE R-T CHARACTERISTICS AND VERY LOW MAGNETORESISTANCE BELOW 1-K

被引:35
作者
WILLEKERS, RW
MATHU, F
MEIJER, HC
POSTMA, H
机构
[1] Faculty of Applied Physics, Delft University of Technology, 2600 GA Delft
关键词
low temperature studies; magnetoresistance; thermometers; thick film resistors;
D O I
10.1016/0011-2275(90)90315-4
中图分类号
O414.1 [热力学];
学科分类号
摘要
A new type of RuO2-based thick film resistor has been investigated for use as a thermometer in the millikelvin temperature range. The resistance versus temperature behaviour between 25 and 800 mK can be described with an accuracy of better than 0.5% by the relation found for conduction by variable-range hopping: R(T) = R0 exp[(T0/T)α], with α = 0.345. This relation was found to be valid down to at least 6 mK with an accuracy of a few per cent. The low temperature resistance behaviour can be predicted within 2% starting from the room temperature resistance value. The thermometers show a small negative magnetoresistance effect from which the apparent temperature change exceeds 2% only at temperatures below 0.1 K and in fields of more than 5 T. No dependence of the magnetoresistance effect on the orientation of the field has been found. © 1990.
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页码:351 / 355
页数:5
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