CORE-LEVEL PHOTOEMISSION MEASUREMENTS OF VALENCE-BAND OFFSETS IN HIGHLY STRAINED HETEROJUNCTIONS - SI-GE SYSTEM

被引：98

作者：

SCHWARTZ, GP

HYBERTSEN, MS

BEVK, J

NUZZO, RG

MANNAERTS, JP

GUALTIERI, GJ

机构：

来源：

关键词：

D O I：

10.1103/PhysRevB.39.1235

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1235 / 1241

页数：7

共 20 条

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