PHOTOLUMINESCENCE AND ELECTRICAL-PROPERTIES OF ERBIUM-DOPED INDIUM OXIDE-FILMS PREPARED BY RF-SPUTTERING

被引:29
作者
KIM, HK [1 ]
LI, CC [1 ]
NYKOLAK, G [1 ]
BECKER, PC [1 ]
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
关键词
D O I
10.1063/1.357882
中图分类号
O59 [应用物理学];
学科分类号
摘要
Erbium-doped indium oxide films were prepared by rf magnetron sputtering. The Er-doped oxide films are conducting (or semiconducting) with a resistivity in the range of 10-3-103 Ω cm, and are optically active, i.e., show a clear room-temperature photoluminescence at 1.54 μm, corresponding to intratransitions in Er3+ ions. Compared with the undoped indium oxide films, the erbium doping was found to have the effect of increasing the resistivity (up to two orders of magnitude) of the films, mainly via a reduction of carrier concentration. Postdeposition annealing in air ambient significantly enhances both the Er3+ luminescence and Hall mobility (up to 60 cm2/V s), and reduces the carrier concentration. Postdeposition annealing in reducing ambient (N2/H2), however, decreases the resistivity dramatically, mainly via an increase of carrier concentration (up to 1020 cm-3), and also enhances the Er3+ luminescence. © 1994 American Institute of Physics.
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页码:8209 / 8211
页数:3
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