A NON-DESTRUCTIVE X-RAY METHOD FOR THE DETERMINATION OF THE THICKNESS OF SURFACE LAYERS

被引：9

作者：

GAY, P

HIRSCH, PB

机构：

来源：

BRITISH JOURNAL OF APPLIED PHYSICS | 1951年 / 2卷 / AUG期

关键词：

D O I：

10.1088/0508-3443/2/8/302

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：218 / 222

页数：5

共 7 条

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[3] A PARALLEL-BEAM CONCENTRATING MONOCHROMATOR FOR X-RAYS
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HIRSCH, PB
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[4] THICKNESS MEASUREMENT OF THIN COATINGS BY X-RAY ABSORPTION
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BIRKS, LS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (03) : 99 - 101
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (09) : 323 - 333
[7] LEGRAND C, 1948, CR HEBD ACAD SCI, V227, P831