X-RAY-DIFFRACTION STUDIES ON THIN EVAPORATED COBALT FILMS

X-ray diffraction profiles of cobalt films 40 to 500 nm thick, condensed on different substrates at 77 and 273 K, have been studied. The hexagonal form was the only one detected. Thick films (500 nm) annealed up to 300 K showed a slight texture with the direction 〈10.1〉 normal to the substrate. Crystallite size was approximately 10 nm. Thin films (100 nm) annealed at 673 K took a strong fibre texture, the direction 〈0.10〉 being normal to the substrate. The average crystallite size was dependent on film thickness and grew 8 times. The morphology of these films was a close packing of columns with the basal plane parallel to the substrate. © 1979.