1ST STM OBSERVATION OF SILICA AND PLATINUM-ON-SILICA MODEL CATALYST SYSTEMS

被引：5

作者：

KOMIYAMA, M

KIRINO, M

机构：

来源：

CHEMISTRY LETTERS | 1992年 / 12期

关键词：

D O I：

10.1246/cl.1992.2301

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning tunneling microscopy (STM) images of silicon oxide surface and of Pt ultrafine particles deposited on it were obtained for the first time. The silicon oxide sample employed consists of a thin (ca. 0.7 nm thick) native silica film present on a Si(100) surface. The STM observation of these sample systems was critically dependent on the choice of the electron tunneling conditions.

引用

页码：2301 / 2302

页数：2

共 8 条

[1] SCANNING TUNNELING MICROSCOPY OF INSULATORS - CAF2 EPITAXY ON SI(111) [J].