ELECTROLESS DEPOSITION OF EPITAXIAL PB1-XHGXS FILMS

被引:46
作者
SHARMA, NC
PANDYA, DK
SEHGAL, HK
CHOPRA, KL
机构
[1] Department of Physics, Indian Institute of Technology, Delhi, New Delhi
关键词
D O I
10.1016/0040-6090(79)90289-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial films of Pb1-xHgxS (x = 0-0.33) were grown on single-crystal (111) Ge and (111) Si substrates by an electroless deposition process under conditions of controlled dilutions and reaction bath temperatures. Electron microscopy and electron diffraction studies show the predominance of [111] and [112] orientations in films grown on (111) Ge and (111) Si substrates respectively. The films grew initially as β′-Pb1-xHgxS up to a thickness of about 800 Å; beyond this thickness the films were α′-Pb1-xHgxS. © 1979.
引用
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页码:157 / 164
页数:8
相关论文
共 4 条
[1]  
HOLMES PJ, 1962, ELECTROCHEMISTRY SEM, P368
[2]   STRUCTURAL-PROPERTIES OF PB1-XHGXS FILMS OF VARIABLE OPTICAL GAP [J].
SHARMA, NC ;
PANDYA, DK ;
SEHGAL, HK ;
CHOPRA, KL .
THIN SOLID FILMS, 1977, 42 (03) :383-391
[3]   STRUCTURAL AND IR PROPERTIES OF PB1-XHGXS THIN-FILMS [J].
SHARMA, NC ;
PANDYA, DK ;
MUKERJEE, AK ;
SEHGAL, HK ;
CHOPRA, KL .
APPLIED OPTICS, 1977, 16 (11) :2945-2948
[4]   SOLUTION GROWTH OF VARIABLE GAP PB1-XHGXS FILMS FOR INFRARED DETECTORS [J].
SHARMA, NC ;
PANDYA, DK ;
SEHGAL, HK ;
CHOPRA, KL .
MATERIALS RESEARCH BULLETIN, 1976, 11 (09) :1109-1113