ATOMIC-FORCE MICROSCOPY ADHESION MEASUREMENTS OF SURFACE-MODIFIED TONERS FOR XEROGRAPHIC APPLICATIONS

被引：39

作者：

OTT, ML

MIZES, HA

机构：

[1] Xerox Corporation, Supplies Development and Manufacturing, Webster Research Center, Webster, NY 14580

来源：

COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 1994年 / 87卷 / 03期

关键词：

ADHESION; ATOMIC FORCE MICROSCOPE; SURFACE ADDITIVES; TONER; XEROGRAPHIC PERFORMANCE;

D O I：

10.1016/0927-7757(94)80072-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have used an atomic force microscope to measure the adhesion of surface-modified toner particles to various surfaces of relevance to xerography. We will present adhesion data on several toner and toner surface additive surface modification techniques and use supporting machine performance data to discuss the advantages and disadvantages of the techniques.

引用

页码：245 / 256

页数：12

共 13 条

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