EFFECT OF FILM STRUCTURE ON PHOTOELECTRIC EMISSION FROM THIN FILMS OF ALUMINIUM

被引：15

作者：

BATT, RJ

MEE, CHB

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1969年 / 6卷 / 04期

关键词：

D O I：

10.1116/1.1315746

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：737 / &

共 17 条

[1] The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J].

Fowler, RH .

PHYSICAL REVIEW, 1931, 38 (01) :45-56

[2]

GARRON R, 1965, ANN PHYS-PARIS, V10, P595

[3] OPTICAL CONSTANTS AND REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM IN VISIBLE AND ULTRAVIOLET [J].

HASS, G ;

WAYLONIS, JE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (07) :719-&

[4] WORK FUNCTION OF POLYCRYSTALLINE TUNGSTEN FOIL [J].

HOPKINS, BJ ;

RIVIERE, JC .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1963, 81 (521) :590-&

[5] WORK FUNCTION CHANGES DUE TO CHEMISORPTION OF WATER AND OXYGEN ON ALUMINUM [J].

HUBER, EE ;

KIRK, CT .

SURFACE SCIENCE, 1966, 5 (04) :447-&

[6] OXIDATION OF ALUMINUM FILMS IN LOW-PRESSURE OXYGEN ATMOSPHERES [J].

KIRK, CT ;

HUBER, EE .

SURFACE SCIENCE, 1968, 9 (02) :217-&

[7] ATTENUATION LENGTH OF PHOTOELECTRONS IN THIN FILMS OF URANIUM [J].

LEA, C ;

MEE, CHB .

PHYSICA STATUS SOLIDI, 1968, 25 (02) :613-&

[8] COMPUTATION OF PHOTOELECTRIC WORK FUNCTIONS USING FOWLER ANALYSIS [J].

LEA, C ;

BLOTT, BH ;

MEE, CHB .

APPLIED OPTICS, 1969, 8 (01) :203-&

[9] LE LIBRE PARCOURS MOYEN DES ELECTRONS DE CONDUCTIBILITE ET DES ELECTRONS PHOTOELECTRIQUES MESURE AU MOYEN DE LA METHODE DES COUCHES MINCES [J].

MAYER, H ;

NOSSEK, R ;

THOMAS, H .

JOURNAL DE PHYSIQUE ET LE RADIUM, 1956, 17 (03) :204-209

[10]

MEESSEN A, 1966, BASIC PROBLEMS THIN, P321

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