NANOSECOND DOUBLE-FRAME ELECTRON-MICROSCOPY OF FAST PHASE-TRANSITIONS

被引:9
作者
BOSTANJOGLO, O
KORNITZKY, J
TORNOW, RP
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1989年 / 22卷 / 12期
关键词
D O I
10.1088/0022-3735/22/12/010
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1008 / 1011
页数:4
相关论文
共 13 条
[1]   EVALUATION OF THE GAS PUFF Z-PINCH AS AN X-RAY-LITHOGRAPHY AND MICROSCOPY SOURCE [J].
BAILEY, J ;
ETTINGER, Y ;
FISHER, A ;
FEDER, R .
APPLIED PHYSICS LETTERS, 1982, 40 (01) :33-35
[2]   NANOSECOND TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION [J].
BOSTANJOGLO, O ;
TORNOW, RP ;
TORNOW, W .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (05) :556-557
[3]   PRODUCING HIGH-CURRENT NANOSECOND ELECTRON PULSES WITH A STANDARD TUNGSTEN HAIRPIN GUN [J].
BOSTANJOGLO, O ;
HEINRICHT, F .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (12) :1491-1493
[4]   NANOSECOND-EXPOSURE ELECTRON-MICROSCOPY OF LASER-INDUCED PHASE-TRANSFORMATIONS [J].
BOSTANJOGLO, O ;
TORNOW, RP ;
TORNOW, W .
ULTRAMICROSCOPY, 1987, 21 (04) :367-372
[5]   TRACING FAST PHASE-TRANSITIONS BY ELECTRON-MICROSCOPY [J].
BOSTANJOGLO, O ;
LIEDTKE, R .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 60 (02) :451-455
[6]  
BOSTANJOGLO O, 1988, BEITRAGE ELEKTRONEMI, V21, P191
[7]  
BOSTANJOGLO O, 1987, SCANNING MICROSC S, V1, P197
[8]  
BOSTANJOGLO O, 1986, MATER RES SOC S P, V71, P345
[9]  
BOSTANJOGLO O, 1988, I PHYS C SER 93, V1, P89
[10]  
CHENG PC, 1984, SPRINGER SERIES OPTI, V43, P285