TEXTURING OF EPITAXIAL INSITU Y-BA-CU-O THIN-FILMS ON CRYSTALLINE SUBSTRATES

被引：41

作者：

ZHENG, JP

DONG, SY

KWOK, HS

机构：

[1] Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Amherst

来源：

APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 05期

关键词：

D O I：

10.1063/1.104580

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The degree of texturing of the grains in epitaxial in situ Y-Ba-Cu-O films was studied by x-ray pole-figure measurements. These high T(c) and J(c) laser deposited films were all aligned with the c axis perpendicular to the substrate surface. It was found that films on SrTiO3(001) and LaAlO3(001) were totally aligned with the YBCO a axis parallel to the <100> direction on the substrate. For MgO(001), 4% of the grains are aligned in the <100> direction. For yttria stabilized zirconia (001), the a axes of the YBCO grains were distributed between the <100> and <110> directions on the substrate. These observations are consistent with the degree of lattice mismatch in the various crystal orientations.

引用

页码：540 / 542

页数：3

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