CHARACTERIZATION OF RECAST NAFION FILMS BY SMALL- AND WIDE-ANGLE X-RAY-SCATTERING

被引:25
作者
HALIM, J
SCHERER, GG
STAMM, M
机构
[1] PAUL SCHERRER INST,CH-5232 VILLIGEN,SWITZERLAND
[2] MAX PLANCK INST POLYMER RES,D-55021 MAINZ,GERMANY
关键词
D O I
10.1002/macp.1994.021951204
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Room temperature recast Nafion(a)) films, prepared under different humidities in the curing atmosphere, were characterized by small- and wide-angle X-ray scattering (SAXS and WAXS). SAXS reveals that the humidity influences the size of the ionic clusters in these polymer films. It was found that the number and size of ionic clusters increases with incresing relative humidity. WAXS indicates the presence of locally ordered regions of the backbone polymer. These results allow a qualitative understanding of the electrochemical behaviour of Nafion recast films cured at different humidities, as described in the literature.
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页码:3783 / 3788
页数:6
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