ELECTRON DISTRIBUTION IN GAAS AS REVEALED BY X-RAY DIFFRACTION

[1] TEMPERATURE DIFFUSE SCATTERING OF X-RAYS IN CUBIC POWDERS .2. CORRECTIONS TO INTEGRATED INTENSITY MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1998 - 2001

[2] ANOMALOUS DISPERSION CORRECTIONS COMPUTED FROM SELF-CONSISTENT FIELD RELATIVISTIC DIRAC-SLATER WAVE FUNCTIONS [J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 17 - &

[3] COVALENT BOND IN SILICON [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455): : 379 - &

[4] ABSOLUTE X-RAY SCATTERING FACTORS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1965, 137 (6A): : 1869 - &

[5] AN X-RAY SEARCH FOR IONICITY IN GAAS [J]. PHYSICS LETTERS, 1964, 13 (03): : 209 - 210

[6] PRAZISIONSBESTIMMUNG DER GITTERKONSTANTEN VON AIIIBV-VERBINDUNGEN [J]. ACTA CRYSTALLOGRAPHICA, 1958, 11 (05): : 369 - 371

[7] GOTTLICHER S, 1959, Z ELEKTROCHEM, V63, P891

[8] INFRARED LATTICE REFLECTION SPECTRA OF III-V COMPOUND SEMICONDUCTORS [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (AUG) : 1099 - +

[9] ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (06) : 988 - &

[10] Hilsum C, 1965, PROGR SEMICOND, V9, P135

[1] TEMPERATURE DIFFUSE SCATTERING OF X-RAYS IN CUBIC POWDERS .2. CORRECTIONS TO INTEGRATED INTENSITY MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1998 - 2001

[2] ANOMALOUS DISPERSION CORRECTIONS COMPUTED FROM SELF-CONSISTENT FIELD RELATIVISTIC DIRAC-SLATER WAVE FUNCTIONS [J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 17 - &

[3] COVALENT BOND IN SILICON [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455): : 379 - &

[4] ABSOLUTE X-RAY SCATTERING FACTORS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1965, 137 (6A): : 1869 - &

[5] AN X-RAY SEARCH FOR IONICITY IN GAAS [J]. PHYSICS LETTERS, 1964, 13 (03): : 209 - 210

[6] PRAZISIONSBESTIMMUNG DER GITTERKONSTANTEN VON AIIIBV-VERBINDUNGEN [J]. ACTA CRYSTALLOGRAPHICA, 1958, 11 (05): : 369 - 371

[7] GOTTLICHER S, 1959, Z ELEKTROCHEM, V63, P891

[8] INFRARED LATTICE REFLECTION SPECTRA OF III-V COMPOUND SEMICONDUCTORS [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (AUG) : 1099 - +

[9] ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (06) : 988 - &

[10] Hilsum C, 1965, PROGR SEMICOND, V9, P135