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QUANTITATIVE-DETERMINATION OF SURFACE-COMPOSITION OF SULFUR BEARING ANION MIXTURES BY AUGER-ELECTRON SPECTROSCOPY
被引:83
作者
:
TURNER, NH
论文数:
0
引用数:
0
h-index:
0
TURNER, NH
MURDAY, JS
论文数:
0
引用数:
0
h-index:
0
MURDAY, JS
RAMAKER, DE
论文数:
0
引用数:
0
h-index:
0
RAMAKER, DE
机构
:
来源
:
ANALYTICAL CHEMISTRY
|
1980年
/ 52卷
/ 01期
关键词
:
D O I
:
10.1021/ac50051a021
中图分类号
:
O65 [分析化学];
学科分类号
:
070302 ;
081704 ;
摘要
:
引用
收藏
页码:84 / 92
页数:9
相关论文
共 38 条
[1]
GRAPHITE PLATE SAMPLE HOLDERS FOR X-RAY PHOTOELECTRON-SPECTROSCOPY
AYLMER, DM
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
AYLMER, DM
RAZZAVI, H
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
RAZZAVI, H
CARVER, JC
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
CARVER, JC
[J].
ANALYTICAL CHEMISTRY,
1979,
51
(04)
: 581
-
583
[2]
INTERPRETATION OF AUGER LVV TRANSITIONS FROM OXIDES OF 3RD-ROW ELEMENTS
BERNETT, MK
论文数:
0
引用数:
0
h-index:
0
BERNETT, MK
MURDAY, JS
论文数:
0
引用数:
0
h-index:
0
MURDAY, JS
TURNER, NH
论文数:
0
引用数:
0
h-index:
0
TURNER, NH
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
12
(04)
: 375
-
393
[3]
RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCE
BERTHOU, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
BERTHOU, H
JORGENSEN, CK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
JORGENSEN, CK
[J].
ANALYTICAL CHEMISTRY,
1975,
47
(03)
: 482
-
488
[4]
DIRECT COMPARISON OF AUGER-ELECTRON SPECTROSCOPY AND ESCA SENSITIVITIES
BRILLSON, LJ
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
BRILLSON, LJ
CEASAR, GP
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
CEASAR, GP
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(09)
: 4195
-
4197
[5]
CARIG NL, 1974, ATMOS ENV, V8, P15
[6]
Carlson T. A., 1975, PHOTOELECTRON AUGER
[7]
OXIDE THICKNESS MEASUREMENTS UP TO 120 A ON SILICON AND ALUMINUM USING CHEMICALLY SHIFTED AUGER-SPECTRA
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHANG, CC
BOULIN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BOULIN, DM
[J].
SURFACE SCIENCE,
1977,
69
(02)
: 385
-
402
[8]
CHANG CC, 1974, CHARACTERIZATION SOL, pCH20
[9]
APPLICATIONS OF ESCA TO POLYMER CHEMISTRY .6. SURFACE FLUORINATION OF POLYETHYLENE - APPLICATION OF ESCA TO EXAMINATION OF STRUCTURE AS A FUNCTION OF DEPTH
CLARK, DT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
CLARK, DT
FEAST, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
FEAST, WJ
MUSGRAVE, WKR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
MUSGRAVE, WKR
RITCHIE, I
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
RITCHIE, I
[J].
JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY,
1975,
13
(04)
: 857
-
890
[10]
THE K-ALPHA TRANSITION IN COMPOUNDS OF SULPHUR
COULSON, CA
论文数:
0
引用数:
0
h-index:
0
COULSON, CA
ZAULI, C
论文数:
0
引用数:
0
h-index:
0
ZAULI, C
[J].
MOLECULAR PHYSICS,
1963,
6
(05)
: 525
-
533
←
1
2
3
4
→
共 38 条
[1]
GRAPHITE PLATE SAMPLE HOLDERS FOR X-RAY PHOTOELECTRON-SPECTROSCOPY
AYLMER, DM
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
AYLMER, DM
RAZZAVI, H
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
RAZZAVI, H
CARVER, JC
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
TEXAS A&M UNIV,DEPT CHEM,COLLEGE STN,TX 77843
CARVER, JC
[J].
ANALYTICAL CHEMISTRY,
1979,
51
(04)
: 581
-
583
[2]
INTERPRETATION OF AUGER LVV TRANSITIONS FROM OXIDES OF 3RD-ROW ELEMENTS
BERNETT, MK
论文数:
0
引用数:
0
h-index:
0
BERNETT, MK
MURDAY, JS
论文数:
0
引用数:
0
h-index:
0
MURDAY, JS
TURNER, NH
论文数:
0
引用数:
0
h-index:
0
TURNER, NH
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1977,
12
(04)
: 375
-
393
[3]
RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCE
BERTHOU, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
BERTHOU, H
JORGENSEN, CK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
UNIV GENEVE,DEPT CHIM MINERALE & ANAL,1211 GENEVA 4,SWITZERLAND
JORGENSEN, CK
[J].
ANALYTICAL CHEMISTRY,
1975,
47
(03)
: 482
-
488
[4]
DIRECT COMPARISON OF AUGER-ELECTRON SPECTROSCOPY AND ESCA SENSITIVITIES
BRILLSON, LJ
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
BRILLSON, LJ
CEASAR, GP
论文数:
0
引用数:
0
h-index:
0
机构:
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
XEROX CORP,JOSEPH C WILSON CTR TECHNOL,WEBSTER,NY 14580
CEASAR, GP
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(09)
: 4195
-
4197
[5]
CARIG NL, 1974, ATMOS ENV, V8, P15
[6]
Carlson T. A., 1975, PHOTOELECTRON AUGER
[7]
OXIDE THICKNESS MEASUREMENTS UP TO 120 A ON SILICON AND ALUMINUM USING CHEMICALLY SHIFTED AUGER-SPECTRA
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHANG, CC
BOULIN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BOULIN, DM
[J].
SURFACE SCIENCE,
1977,
69
(02)
: 385
-
402
[8]
CHANG CC, 1974, CHARACTERIZATION SOL, pCH20
[9]
APPLICATIONS OF ESCA TO POLYMER CHEMISTRY .6. SURFACE FLUORINATION OF POLYETHYLENE - APPLICATION OF ESCA TO EXAMINATION OF STRUCTURE AS A FUNCTION OF DEPTH
CLARK, DT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
CLARK, DT
FEAST, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
FEAST, WJ
MUSGRAVE, WKR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
MUSGRAVE, WKR
RITCHIE, I
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
UNIV DURHAM,DEPT CHEM,DURHAM CITY,ENGLAND
RITCHIE, I
[J].
JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY,
1975,
13
(04)
: 857
-
890
[10]
THE K-ALPHA TRANSITION IN COMPOUNDS OF SULPHUR
COULSON, CA
论文数:
0
引用数:
0
h-index:
0
COULSON, CA
ZAULI, C
论文数:
0
引用数:
0
h-index:
0
ZAULI, C
[J].
MOLECULAR PHYSICS,
1963,
6
(05)
: 525
-
533
←
1
2
3
4
→