STRUCTURE AND PROPERTIES OF VACUUM-DEPOSITED THIN-FILMS - NEW BASIC RELATIONSHIP

被引：48

作者：

VINCETT, PS

BARLOW, WA

ROBERTS, GG

机构：

[1] XEROX RES CTR CANADA,MISSISSAUGA L5L 1J9,ONTARIO,CANADA

[2] ICI,CORP LAB,RUNCORN WA7 4QE,CHESHIRE,ENGLAND

[3] UNIV DURHAM,DEPT APPL PHYS & ELECTR,DURHAM DH1 3LE,ENGLAND

来源：

JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 09期

关键词：

D O I：

10.1063/1.324299

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3800 / 3806

页数：7

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[9] AN EMPIRICAL CORRESPONDING-STATES RELATIONSHIP FOR LIQUID VISCOSITY [J].

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[10] ROLE OF DEFECTS IN DETERMINING ELECTRICAL PROPERTIES OF CDS THIN-FILMS .2. STACKING-FAULTS [J].

KAZMERSKI, LL ;

BERRY, WB ;

ALLEN, CW .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (08) :3521-+

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