CHARACTERISTICS OF LASER-DIODES FOR INTERFEROMETRIC USE

被引:44
作者
NING, YN
GRATTAN, KTV
MEGGITT, BT
PALMER, AW
机构
来源
APPLIED OPTICS | 1989年 / 28卷 / 17期
关键词
D O I
10.1364/AO.28.003657
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:3657 / 3661
页数:5
相关论文
共 7 条
[1]   FIBEROPTIC THERMOMETER USING SEMICONDUCTOR-ETALON SENSOR [J].
BEHEIM, G .
ELECTRONICS LETTERS, 1986, 22 (05) :238-239
[2]   FIBRE-OPTIC INTERFEROMETRIC SENSOR UTILIZING LOW COHERENCE LENGTH SOURCE - RESOLUTION ENHANCEMENT [J].
GERGES, AS ;
FARAHI, F ;
NEWSON, TP ;
JONES, JDC ;
JACKSON, DA .
ELECTRONICS LETTERS, 1988, 24 (08) :472-474
[3]   INTERFEROMETRIC FIBEROPTIC SENSOR USING A SHORT-COHERENCE-LENGTH SOURCE [J].
GERGES, AS ;
FARAHI, F ;
NEWSON, TP ;
JONES, JDC ;
JACKSON, DA .
ELECTRONICS LETTERS, 1987, 23 (21) :1110-1111
[4]  
Mariller C., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V798, P121, DOI 10.1117/12.941095
[5]   NOVEL METHOD FOR HIGH-RESOLUTION MEASUREMENT OF LASER OUTPUT SPECTRUM [J].
OKOSHI, T ;
KIKUCHI, K ;
NAKAYAMA, A .
ELECTRONICS LETTERS, 1980, 16 (16) :630-631
[6]   NOISE AND DISTORTION CHARACTERISTICS OF SEMICONDUCTOR-LASERS IN OPTICAL FIBER COMMUNICATION-SYSTEMS [J].
PETERMAN, K ;
ARNOLD, G .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (04) :543-555
[7]   DIRECT OBSERVATION OF LORENTZIAN LINESHAPE OF SEMICONDUCTOR-LASER AND LINEWIDTH REDUCTION WITH EXTERNAL GRATING FEEDBACK [J].
SAITO, S ;
YAMAMOTO, Y .
ELECTRONICS LETTERS, 1981, 17 (09) :325-327