HARD PHOTON YIELDS FROM (70-240) GEV ELECTRONS INCIDENT NEAR AXIAL DIRECTIONS ON SI, GE AND W SINGLE-CRYSTALS WITH A LARGE THICKNESS VARIATION

被引:33
作者
MEDENWALDT, R
MOLLER, SP
TANGPETERSEN, S
UGGERHOJ, E
ELSENER, K
HAGEALI, M
SIFFERT, P
STOQUERT, J
SONA, P
MAIER, K
机构
[1] CERN,CH-1211 GENEVA 23,SWITZERLAND
[2] UNIV FLORENCE,DEPARTIMENTO FIS,I-50121 FLORENCE,ITALY
[3] IST NAZL FIS NUCL,I-50125 FLORENCE,ITALY
[4] MAX PLANCK INST MET RES,W-7000 STUTTGART 80,GERMANY
关键词
D O I
10.1016/0370-2693(90)91805-L
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The dramatic peak found in photon spectra from 150 GeV channelled electrons has for the first time been investigated for 70, 150, and 240 GeV electrons incident on crystals with thickness from 100μ (Si). Very pronounced variations for the high energy part of the photon spectra are found. In Si the photon peak is not found for lower energies and thin crystals. For well-aligned electrons in Si the yield is more than 160 times the Bethe-Heitler one. In general the peak in the photon spectra disaapears for incident angles larger than half the critical angle for channeling. Dramatic radiative energy losses are found along axial directions - in 0.6 mm 〈110〉 Ge a 150 GeV electron loses more than 60% of its total energy. © 1990.
引用
收藏
页码:517 / 522
页数:6
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