SOLID-STATE ENERGY-DISPERSION SPECTROMETER FOR ELECTRON-MICROPROBE X-RAY ANALYSIS

被引：98

作者：

FITZGERALD, R

KEIL, K

HEINRICH, KF

机构：

来源：

SCIENCE | 1968年 / 159卷 / 3814期

关键词：

D O I：

10.1126/science.159.3814.528

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

[No abstract available]

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页码：528 / +

页数：1

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[2] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY
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