INVESTIGATIONS OF THE OCVD TRANSIENTS IN SOLAR-CELLS

被引：14

作者：

CASTANER, L

VILAMAJO, E

LLABERIA, J

GARRIDO, J

机构：

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1981年 / 14卷 / 10期

关键词：

D O I：

10.1088/0022-3727/14/10/019

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1867 / 1876

页数：10

共 13 条

[1] OBSERVATIONS ON A METHOD OF DETERMINING CARRIER LIFETIME IN P+-NU-N+ DIODES [J].

BASSETT, RJ .

SOLID-STATE ELECTRONICS, 1969, 12 (05) :385-&

[2]

BRAUNSTEIN A, 1977, ENERGY CONV, V17

[3]

CASTANER L, 1979, 2ND P C INT EN SOL B

[4]

CASTANER L, 1978, 1ST P EUR S PHOT GEN, P23

[5] OPEN CIRCUIT VOLTAGE DECAY BEHAVIOR OF JUNCTION DEVICES [J].

CHOO, SC ;

MAZUR, RG .

SOLID-STATE ELECTRONICS, 1970, 13 (05) :553-&

[6]

IMANURA MS, 1970, 8TH P IEEE PHOT SPEC, P106

[7] METHODOLOGY FOR EXPERIMENTALLY BASED DETERMINATION OF GAP SHRINKAGE AND EFFECTIVE LIFETIMES IN EMITTER AND BASE OF P-N-JUNCTION SOLAR-CELLS AND OTHER P-N-JUNCTION DEVICES [J].

LINDHOLM, FA ;

NEUGROSCHEL, A ;

SAH, CT ;

GODLEWSKI, MP ;

BRANDHORST, HW .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (04) :402-410

[8] MEASUREMENT OF MINORITY-CARRIER LIFETIME IN SOLAR-CELLS FROM PHOTOINDUCED OPEN-CIRCUIT VOLTAGE DECAY [J].

MAHAN, JE ;

EKSTEDT, TW ;

FRANK, RI ;

KAPLOW, R .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (05) :733-739

[9]

NEUGROSCHEL A, 1977, IEEE T ELECTRON DEV, V24, P662, DOI 10.1109/T-ED.1977.18800

[10] DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS [J].

NEUGROSCHEL, A ;

CHEN, PJ ;

PAO, SC ;

LINDHOLM, FA .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (04) :485-490

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