TEMPERATURE SENSITIVITY OF AUGER-RECOMBINATION EFFECTS IN COMPRESSIVELY STRAINED INXGA1-XAS/INXGA1-XAS1-YPY QUANTUM-WELL LASERS

被引:9
作者
LUI, WW
YAMANAKA, T
YOSHIKUNI, Y
SEKI, S
YOKOYAMA, K
机构
[1] NTT Opto-Electronics Laboratories, Wakamiya, Atsugi, Kanagawa
来源
PHYSICAL REVIEW B | 1993年 / 48卷 / 12期
关键词
D O I
10.1103/PhysRevB.48.8814
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A Monte Carlo analysis of the Auger-recombination effects in compressively strained quantum-well diode lasers covering a wide range of temperature has been carried out. Contrary to the conventional theory where Boltzmann statistics and parabolic band approximations were assumed, in this work, realistic valence-band structure of strained quantum wells and Fermi-Dirac statistics are employed. The results of calculations show that the temperature sensitivity of the Auger-recombination effect, as opposed to that predicted in the conventional theory, is an acute function of all variables considered: strain, carrier density, and temperature. In particular, it is found that under low carrier density levels or high temperature, the temperature sensitivity of the Auger-recombination coefficient in quantum wells is expected to be low regardless of the detailed structures of the valence subbands. Based on a sensitivity analysis of the Auger-recombination effects with respect to the spin-orbit splitting, it is also found that the temperature dependence of the Auger effects discussed in this report should remain valid within a reasonable range of uncertainty in the value of the spin-orbit splitting.
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页码:8814 / 8822
页数:9
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