THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FOR PARTICLE-SHAPE CHARACTERIZATION

被引：24

作者：

HEFFELS, CMG ^{[1
]}

HEITZMANN, D ^{[1
]}

HIRLEMAN, ED ^{[1
]}

SCARLETT, B ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT MECH & AEROSP ENGN,LASER DIAGNOST LAB,TEMPE,AZ 85287

来源：

PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION | 1994年 / 11卷 / 03期

关键词：

D O I：

10.1002/ppsc.19940110305

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Forward light scattering is a well established technique for measuring particle size distributions. The light intensity fluctuations which can be observed in the diffraction plane of the instrument can be used to stabilize the inversion process [1]. Particle shape information is also present in these fluctuations. It is shown that an azimuthal-type of detector can be used to extract this information from the statistical correlations of the detector signals.

引用

页码：194 / 199

页数：6

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