IMPROVEMENT OF HIGH-ANGLE DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY (HADOX) FOR MEASURING TEMPERATURE-DEPENDENCE OF LATTICE-CONSTANTS .1. THEORY

被引：29

作者：

OKAZAKI, A

OHAMA, N

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1979年 / 12卷 / OCT期

关键词：

D O I：

10.1107/S0021889879013005

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：450 / 454

页数：5

共 21 条

[1] CHANGE OF LATTICE PARAMETERS OF SRTIO3 NEAR PHASE TRANSITION AT 108 DEGREES K [J].

ALEFELD, B .

ZEITSCHRIFT FUR PHYSIK, 1969, 222 (02) :155-&

[2] ABSOLUTE MEASUREMENT OF LATTICE-PARAMETER OF GERMANIUM USING MULTIPLE-BEAM X-RAY-DIFFRACTOMETRY [J].

BAKER, JFC ;

HART, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1) :364-367

[3]

Baker TW, 1968, ADVANCES XRAY ANALYS, V11, P359

[4]

BAKER TW, 1969, R5152 AERE REF

[5] PRECISION LATTICE CONSTANT DETERMINATION [J].

BOND, WL .

ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :814-818

[6]

BOND WL, 1975, ACTA CRYSTALLOGR A, V31, P698, DOI 10.1107/S0567739475001465

[7] DOUBLE CRYSTAL X-RAY DILATOMETER USING CONTINUOUS RADIATION [J].

BOTTOM, VE ;

CARVALHO, RA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (02) :196-&

[8]

COMPTON AH, 1935, XRAYS THEORY EXPT, P674

[9]

Freund A., 1972, Journal of Crystal Growth, V13-14, P247, DOI 10.1016/0022-0248(72)90163-7

[10] PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].

FUKAMACHI, T ;

HOSOYA, S ;

TERASAKI, O .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1) :117-122

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