THE SURFACE CHEMICAL-ANALYSIS OF A SERIES OF PERSULFATE-INITIATED CHARGE-STABILIZED POLY(BUTYL METHACRYLATE) LATICES USING XPS AND STATIC SIMS

The application of secondary ion mass spectrometry and X-ray photoelectron spectroscopy to the surface chemical analysis of a series of model poly(butyl methacrylate) colloids prepared with various concentrations of persulfate initiator is reported. The surface analysis techniques provide complimentary information on surface polymer structure including the nature of the end groups arising during particle formation. The SIMS and XPS results showed an excellent correlation with data from other physical measurements (electrophoretic mobility, molecular weight, and particle size). © 1993 Academic Press, Inc.