ANOMALOUS MULTILAYER RELAXATION OF PD(001)

被引:72
作者
QUINN, J [1 ]
LI, YS [1 ]
TIAN, D [1 ]
LI, H [1 ]
JONA, F [1 ]
MARCUS, PM [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
PHYSICAL REVIEW B | 1990年 / 42卷 / 17期
关键词
D O I
10.1103/PhysRevB.42.11348
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A low-energy electron-diffraction intensity analysis of a clean Pd{001} surface finds the first interlayer spacing expanded by about 3% and the second interlayer spacing slightly contracted by about 1% with respect to the bulk value (1.945). These results contradict the trend usually observed or theoretically predicted on fcc {001} surfaces, where the first relaxation is a compression and the second is an expansion. Possible origins of this behavior are suggested. © 1990 The American Physical Society.
引用
收藏
页码:11348 / 11351
页数:4
相关论文
共 37 条
[1]   STRUCTURE OF CO ADSORBED ON PD(100) - LEED AND HREELS ANALYSIS [J].
BEHM, RJ ;
CHRISTMANN, K ;
ERTL, G ;
VANHOVE, MA ;
THIEL, PA ;
WEINBERG, WH .
SURFACE SCIENCE, 1979, 88 (2-3) :L59-L66
[2]   1ST PRINCIPLES CALCULATION OF LATTICE-RELAXATION AND SURFACE PHONONS ON AL(100) [J].
BOHNEN, KP ;
HO, KM .
SURFACE SCIENCE, 1988, 207 (01) :105-117
[3]  
Falicov L.M., COMMUNICATION
[4]  
FALICOV LM, 1990, SPRINGER P PHYSICS, V50, P22
[5]   THEORY OF ELECTRONIC-STRUCTURE AND MAGNETIC-BEHAVIOR OF FCC IRON GROWN ON CU(001) [J].
FERNANDO, GW ;
COOPER, BR .
PHYSICAL REVIEW B, 1988, 38 (05) :3016-3027
[6]   SOME OBSERVATIONS ON THE USE OF RELIABILITY INDEXES IN LEED CRYSTALLOGRAPHY [J].
HENGRASMEE, S ;
MITCHELL, KAR ;
WATSON, PR ;
WHITE, SJ .
CANADIAN JOURNAL OF PHYSICS, 1980, 58 (02) :200-206
[7]  
HUANG H, 1986, SURF SCI, V172, P363, DOI 10.1016/0039-6028(86)90761-2
[8]   GIANT INTERNAL MAGNETIC PRESSURE AND COMPRESSIBILITY ANOMALIES [J].
JANAK, JF ;
WILLIAMS, AR .
PHYSICAL REVIEW B, 1976, 14 (09) :4199-4204
[9]   NEW TRANSFER-MATRIX METHOD FOR LOW-ENERGY-ELECTRON DIFFRACTION AND OTHER SURFACE ELECTRONIC-STRUCTURE PROBLEMS [J].
JEPSEN, DW .
PHYSICAL REVIEW B, 1980, 22 (12) :5701-5715
[10]   ATOMIC-STRUCTURE OF AN IMPURITY-STABILIZED SI[111] SURFACE - REFINEMENT USING A COMBINED-LAYER METHOD [J].
JEPSEN, DW ;
SHIH, HD ;
JONA, F ;
MARCUS, PM .
PHYSICAL REVIEW B, 1980, 22 (02) :814-824