EFFECTS OF WEAK EXTERNAL ELECTRIC-FIELDS ON PHOTON AND PARTICLE-EMISSION FROM ION-BOMBARDED SOLID ARGON

被引：12

作者：

GROSJEAN, DE ^{[1
]}

BARAGIOLA, RA ^{[1
]}

BROWN, WL ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 08期

关键词：

D O I：

10.1103/PhysRevLett.74.1474

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have observed that a weak applied external electric field dramatically affects the secondary electron emission, luminescence, and electronic sputtering from thin Ar films bombarded by MeV H+, He+, and Ne+. For MeV H+ and an external field of only 70 V/cm, the electron yield is equal to the number of electron-hole pairs created, the luminescence from the electron-hole recombinations is eliminated, and the sputtering is reduced by 45%. These effects decrease for heavier projectiles. For the first time, the relative contributions of ionizations and excitations to sputtering can be separated. © 1995 The American Physical Society.

引用

页码：1474 / 1477

页数：4

共 19 条

[1]

BARAGIOLA RA, 1994, LOW ENERGY ION SURFA, P187

[2] METAL PHOTOCATHODES AS SECONDARY STANDARDS FOR ABSOLUTE INTENSITY MEASUREMENTS IN VACUUM ULTRAVIOLET [J].