PSEUDOMORPHISM IN (100) NI-CU SYSTEM

被引:37
作者
KUNTZE, R
CHAMBERS, A
PRUTTON, M
机构
[1] Physics Department, University of York, Heslington, York
关键词
D O I
10.1016/0040-6090(69)90020-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-resolution electron diffraction patterns have been measured with a micro-densitometer, giving direct and unambiguous evidence of pseudomorphism. This technique is shown to give extremely accurate misfit values. The systems studied, Ni/(100)Cu and Cu/(100)Ni, show some remarkable differences. A tentative explanation for these, in terms of possible interference from oxide layers, is suggested. © 1969.
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页码:47 / &
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