SOLID-STATE SHOT-NOISE

被引:100
作者
LANDAUER, R
机构
[1] IBM, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1103/PhysRevB.47.16427
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Shot noise and thermal-equilibrium noise are often, and incorrectly, viewed as additive and independent noise sources. The two forms of noise can even be identical, as recognized by several pioneering investigators long ago. Shot noise measures the graininess of the conduction process, and in samples with a fixed number of carriers, where the mean free path is short compared to the sample length, it is determined by the passage of a carrier through its mean free path. For a classical nondegenerate conductor we show that shot noise calculated that way is the thermal-equilibrium current. For mesoscopic conductors that transmit elastically with a probability small compared to unity, thermal-equilibrium noise is also shown to be approximately the sum of two shot-noise terms, one for the arriving stream at each reservoir. For a semiclassical metallic conductor, at zero-temperature, the noise proportional to current flow is shot noise related to the charge transferred between sample electrodes, when a carrier goes through a mean free path. At higher temperatures, a suggestive physical argument is used to show that noise increases above thermal-equilibrium noise according to the square of the ratio of the energy gained in one mean free path, to the thermal energy.
引用
收藏
页码:16427 / 16432
页数:6
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