IMPURITY SEGREGATION STUDY AT THE SURFACE OF YTTRIA-ZIRCONIA ELECTROLYTES BY XPS

被引:36
作者
HUGHES, AE
BADWAL, SPS
机构
[1] CSIRO, Division of Materials Science and Technology, Clayton, 3168 Vic., Normanby Road
关键词
D O I
10.1016/0167-2738(90)90348-U
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The segregation of yttrium as a function of the heat treatment has been studied on the external surface of polycrystalline yttria-zirconia electrolytes with X-ray photoelectron spectroscopy (XPS). Yttrium segregates at the external surface along with a number of impurities dominated by silicon. Generally, silicon segregates in a small region near the surface, whereas the enrichment region for yttrium is considerably deeper. Grain boundary migration appears to be the predominant mechanism for impurity segregation at the external surface. © 1990.
引用
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页码:312 / 315
页数:4
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